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VLSI 2010 Annual Symposium
by Voros, Nikolaos.
Publication:
. X, 346 p.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
by Krishnaswamy, Smita.
Publication:
. XI, 123 p. 71 illus.
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Models in Hardware Testing
by Wunderlich, Hans-Joachim.
Publication:
. XIV, 257 p.
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Fault-Tolerant Design
by Dubrova, Elena.
Publication:
. XV, 185 p. 84 illus.
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Predictive Technology Model for Robust Nanoelectronic Design
by Cao, Yu.
Publication:
. XV, 173 p.
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Test and Diagnosis for Small-Delay Defects
by Tehranipoor, Mohammad.
Publication:
. XVI, 212p. 114 illus.
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Soft Errors in Modern Electronic Systems
by Nicolaidis, Michael.
Publication:
. XVIII, 318 p.
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